DFT ATPG 名詞

ATE: Automatic Test Equipment

ATPG: Automatic Test Pattern Generation

BIST: Built-In Self-Test

BSD: Boundary Scan Design (IEEE 1149.1)

BSDL: Boundary Scan Description Language

DFT: Design For Test

DRC: (Test) Design Rule Check

DUT: Device Under Test

IDDQ: Static Quiescent Current

STIL: Standard Test Interface Language (IEEE 1450)
pronounced same as “style”


BSDC: Boundary Scan Design Compiler

DFTC: Design for Test Compiler

GSV: Graphical Schematic Viewer (in TetraMAX)

SPF: STIL Procedures File (Test Protocol in STIL format);
not to be confused with Standard Parasitic Format